has been cited by the following articles in journals that are participating in CrossRef's forward linking service: |
||
| Rotational disorder in few-layer graphene films on
6H-SiC(000-1)
: A scanning tunneling microscopy study François Varchon, Pierre Mallet, Laurence Magaud, and Jean-Yves Veuillen Physical Review B (2008) 77: 165415 Link to Article |
||
| Detailed scanning probe microscopy tip models determined from simultaneous atom-resolved AFM and STM studies of the
TiO_{2}(110)
surface Georg H. Enevoldsen, Henry P. Pinto, Adam S. Foster, Mona C. R. Jensen, Angelika Kühnle, Michael Reichling, Werner A. Hofer, Jeppe V. Lauritsen, and Flemming Besenbacher Physical Review B (2008) 78: 045416 Link to Article |
||
| Topology and electron scattering properties of the electronic interfaces in epitaxial graphene probed by resonant tunneling
spectroscopy H. Yang, G. Baffou, A. J. Mayne, G. Comtet, G. Dujardin, and Y. Kuk Physical Review B (2008) 78: 041408 Link to Article |
||
| Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force
spectroscopy Boris J. Albers, Marcus Liebmann, Todd C. Schwendemann, Mehmet Z. Baykara, Markus Heyde, Miquel Salmeron, Eric I. Altman, and Udo D. Schwarz Review of Scientific Instruments (2008) 79: 033704 Link to Article |
||
| Graphitization of polymer surfaces by low-energy ion irradiation I. Lazareva, Y. Koval, M. Alam, S. Strömsdörfer, and P. Müller Applied Physics Letters (2007) 90: 262108 Link to Article |
||
| Substrate-induced bandgap opening in epitaxial graphene S. Y. Zhou, G.-H. Gweon, A. V. Fedorov, P. N. First, W. A. de Heer, D.-H. Lee, F. Guinea, A. H. Castro Neto, and A. Lanzara Nature Materials (2007) 6: 770 Link to Article |
||
| Hofstadter butterflies of bilayer graphene Norbert Nemec and Gianaurelio Cuniberti Physical Review B (2007) 75: 201404 Link to Article |
||
| Electron states of mono- and bilayer graphene on SiC probed by scanning-tunneling microscopy P. Mallet, F. Varchon, C. Naud, L. Magaud, C. Berger, and J.-Y. Veuillen Physical Review B (2007) 76: 041403 Link to Article |
||
| Electronic structure of bilayer graphene: A real-space Green’s function study Z. F. Wang, Qunxiang Li, Haibin Su, Xiaoping Wang, Q. W. Shi, Jie Chen, Jinlong Yang, and J. G. Hou Physical Review B (2007) 75: 085424 Link to Article |
||
| Simultaneous current-, force-, and work-function measurement with atomic resolution M. Herz, Ch. Schiller, F. J. Giessibl, and J. Mannhart Applied Physics Letters (2005) 86: 153101 Link to Article |
||
| Nanometer-scale mechanical properties probed by two-dimensional dynamic force spectroscopy with rigid cantilever M. Brun, S. Decossas, F. Triozon, R. Rannou, and B. Grévin Applied Physics Letters (2005) 87: 133101 Link to Article |
||
| Lateral manipulation of single atoms at semiconductor surfaces using atomic force microscopy Noriaki Oyabu, Yoshiaki Sugimoto, Masayuki Abe, Óscar Custance, and Seizo Morita Nanotechnology (2005) 16: S112 Link to Article |
||
| Interpretation of the atomic scale contrast obtained on graphite and single-walled carbon nanotubes in the dynamic mode of
atomic force microscopy Makoto Ashino, Alexander Schwarz, Hendrik Hölscher, Udo D Schwarz, and Roland Wiesendanger Nanotechnology (2005) 16: S134 Link to Article |
||
| Local Spectroscopy and Atomic Imaging of Tunneling Current, Forces, and Dissipation on Graphite S. Hembacher, F. J. Giessibl, and J. Mannhart Physical Review Letters (2005) 94: 056101 Link to Article |
||
| Nanostructured surfaces: challenges and frontiers in nanotechnology Federico Rosei Journal of Physics Condensed Matter (2004) 16: S1373 Link to Article |
||
| Stability considerations and implementation of cantilevers allowing dynamic force microscopy with optimal resolution: the
qPlus sensor F J Giessibl, S Hembacher, M Herz, Ch Schiller, and J Mannhart Nanotechnology (2004) 15: S79 Link to Article |
||
| Double quartz tuning fork sensor for low temperature atomic force and scanning tunneling microscopy M. Heyde, M. Kulawik, H.-P. Rust, and H.-J. Freund Review of Scientific Instruments (2004) 75: 2446 Link to Article |
||